Jean-François Bonnefon

Jean-François Bonnefon

TSE Research Faculty

CNRS

Senior Researcher CNRS

Alicia von Schenk, Victor Klockmann, Jean-François Bonnefon, Iyad Rahwan, and Nils Köbis, “Lie-detection algorithms attract few users but vastly increase accusation rates”, TSE Working Paper, n. 23-1448, June 2023.

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Jean-François Bonnefon, Wim De Neys, and Astrid Hopfensitz, “The Modular Nature of Trustworthiness Detection”, TSE Working Paper, n. 12-311, May 2012.

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Contact

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Office : T.426